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Proceedings Paper

Study on the cloud layer height and properties in Hefei observed by lidar
Author(s): Zhenyi Chen; Wenqing Liu; Yujun Zhang; Junfeng He; Jun Ruan; Sheng Li; Yiben Cui
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Paper Abstract

A co-axial transmission elastic-backscattered lidar aiming to detect the optical properties of the clouds is presented in this paper. The modular co-axial design can guarantee the consistency of the transmitting part and the receiving part. In practice a specific diaphragm is used to suppress the stray light of the primary mirror and background light to improve SNR of the backscattered signal in the daytime. So the near ground signal must be corrected with the appropriate overlap factor. A Licel transient recorder is used for data acquisition in analog and photon counting combined in one acquisition system. With the 15 MHz sampling rate, the spatial resolution of 10 m can be attained. The control over the transient recorder and the treatment of the data is performed on a PC. After getting the correctional backscattered signal, retrieving and analyzing the extinction coefficient profile, the cloud base, cloud peak and related optical parameters of the clouds can be confirmed. In order to testify the feasibility of our lidar, it was implemented with a Finland ceilometer Vaisala simultaneously in May in 2008 in Hefei. Results show the lidar system is stable and the data is reliable.

Paper Details

Date Published: 22 October 2010
PDF: 6 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765828 (22 October 2010); doi: 10.1117/12.865730
Show Author Affiliations
Zhenyi Chen, Anhui Institute of Optics and Fine Mechanics (China)
Wenqing Liu, Anhui Institute of Optics and Fine Mechanics (China)
Yujun Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Junfeng He, Anhui Institute of Optics and Fine Mechanics (China)
Jun Ruan, Anhui Institute of Optics and Fine Mechanics (China)
Sheng Li, Anhui Institute of Optics and Fine Mechanics (China)
Yiben Cui, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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