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Proceedings Paper

The impact of manufacturing errors of domain structure on frequency doubling efficiency in PPLN waveguides
Author(s): Zhengying Liu; Aihong Ren; Rongzhu Zhang; Jinglun Liu; Nianchun Sun; Jianguo Chen
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Paper Abstract

While the length of polarization period in the periodically poled (PP) waveguides has manufacturing errors (MEs), the impact of this errors on Quasi-Phase-Macthed (QPM) frequency doubling efficiency (FDE), and that of polarization period Λ0 and length of the waveguides at the direction of transmission beams on ME tolerance, which are all theoretically analyzed. The results show that with the ME increasing, FDE decreases rapidly. And the ME tolerance of PP waveguides is inversely proportional to the length of waveguides and is directly proportional to the polarization period Λ0. These results provide a theoretical basis for choosing material of periodically poled crystal (PPC) and controlling MEs.

Paper Details

Date Published: 22 October 2010
PDF: 5 pages
Proc. SPIE 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 76570W (22 October 2010); doi: 10.1117/12.865718
Show Author Affiliations
Zhengying Liu, Sichuan Univ. (China)
Aihong Ren, Sichuan Univ. (China)
Rongzhu Zhang, Sichuan Univ. (China)
Jinglun Liu, Sichuan Univ. (China)
Nianchun Sun, Sichuan Univ. (China)
Jianguo Chen, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 7657:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Tianchun Ye; Sen Han; Masaomi Kameyama; Song Hu, Editor(s)

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