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Proceedings Paper

Design and research of analysis instrument based on Q-switch micro-crystal UV laser-induced fluorescence spectroscopy
Author(s): Suping Yu; Hanguang Han; Jinming Yu; Yinping Fu
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Paper Abstract

The physical principle of micro- crystal UV Laser-Induced Fluorescence Spectroscopy (MUV-LIF) is expatiated in the paper, and the application of MUV-LIF to organic matter is studied. Then a portable intelligent analysis instrument based on MUV-LIF is designed. The instrument is composed of following units-----excitation source module based on micro-crystal UV laser, laser driving and controlling module, sample cell, spectroscopy-detecting module, processing and displaying module. Especially, because of high peak power and high repetition frequency rate, Qswitch micro-crystal UV laser is selected as excitation source. MUV-laser module of the instrument is singlepolarization solid-state coherent sources. The module is quasi monolithic integrated. The MUV-laser emits at wavelengths of 355nm, 266nm and 213nm, and it has many advantages, such as high peak power (greater than 30kw), high repeat frequency rate (greater than 10kHz), subnanosecond pulse (less than 500ps pulse width). So the excitation source module is an efficient compact high-order harmonic laser system. Laser driving and controlling module supplies power regulator and temperature controller for MUV-laser. Fluorescence spectroscopy image is produced by spectroscopy-detecting module and pre-processed in processing module. Qualitative and semi-quantitative analysis of sample can be conducted by referring to fluorescence spectroscopy feature library. The experimental results express that lots of organic matter, e.g. melamine, can be detected. The portal instrument has high SNR and sensitivity.

Paper Details

Date Published: 12 October 2010
PDF: 8 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76565U (12 October 2010); doi: 10.1117/12.865703
Show Author Affiliations
Suping Yu, Donghua Univ. (China)
Hanguang Han, Donghua Univ. (China)
Jinming Yu, Donghua Univ. (China)
Yinping Fu, Donghua Univ. (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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