Share Email Print
cover

Proceedings Paper

Effects of mechanical inaccuracies on the measurement result in metrology systems
Author(s): Florian Schneider; Markus Schinhaerl; Christian Vogt; Roland Maurer; Peter Sperber; Rolf Rascher; Richard Stamp; Gordon Smith
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Metrological systems commonly consist of a mechanical axial framework. However, any mechanical inaccuracies in such axial systems may cause falsifications in the measurement results. Therefore, precise knowledge of the effects of mechanical inaccuracies on measurement results is essential for measurement error compensation. This paper discusses the results of a testing series with a topographical coordinate measurement machine for the measurement of precision optical components in order to analyse and specify the different effects of mechanical inaccuracies on measurement results. The results obtained are not only beneficial for the design of new measurement machines and techniques. They may also be advantageously used for rapid measurement error compensation in metrological systems.

Paper Details

Date Published: 11 October 2010
PDF: 11 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765611 (11 October 2010); doi: 10.1117/12.865697
Show Author Affiliations
Florian Schneider, Univ. of Applied Sciences Deggendorf (Germany)
Univ. of the West of England (United Kingdom)
Markus Schinhaerl, Univ. of Applied Sciences Deggendorf (Germany)
Christian Vogt, Univ. of Applied Sciences Deggendorf (Germany)
Roland Maurer, Univ. of Applied Sciences Deggendorf (Germany)
Peter Sperber, Univ. of Applied Sciences Deggendorf (Germany)
Rolf Rascher, Univ. of Applied Sciences Deggendorf (Germany)
Richard Stamp, Univ. of the West of England (United Kingdom)
Gordon Smith, Univ. of the West of England (United Kingdom)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top