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Proceedings Paper

Fiber temperature measurement system by the demodulation of F-P filter
Author(s): Dongdong Wang; Jinfeng Zhou
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Paper Abstract

The laser from broadband laser source enters into the fiber Bragg grating after drilling through the coupler, if it meets the conditions to specific wavelength, the light will be reflected in accordance with backtrack by Fiber Bragg Grating, and enters into F-P filter. Wavelength selected by F-P filter, so various peaks of corresponding wavelength will be detected by photoelectric detector, F-P filter measures the wavelength reflected by fiber grating sensor, and transforms the wavelength signals into electrical signals directly. Consequently, According to empirical formula we can get the corresponding temperature. However, when the temperature changes, that the cavity length of the F-P filter will cause excursion and the measurements of Fiber Bragg Grating Wavelength will cause error will make error on temperature. So before formatting the system we should get the calibration of measuring system by accidental devices. That is to say, we get the calibration of central wavelength of the FBG. In this paper, DSP system generates scanning voltage of the F-P filter and collects voltage signal. So we get the scanning voltage of transmission peak wavelength of the F-P filter, thus a record of all wavelength - voltage relationship for the data can be obtained by us. This is the basis and standards that the wavelength-voltage data is used to demodulate the wavelength of FBG.

Paper Details

Date Published: 12 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765640 (12 October 2010); doi: 10.1117/12.865575
Show Author Affiliations
Dongdong Wang, Beijing Univ. of Technology (China)
Jinfeng Zhou, Beijing Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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