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Proceedings Paper

Research on aircraft trailing vortex detection based on laser's multiplex information echo
Author(s): Nan-xiang Zhao; Yong-hua Wu; Yi-hua Hu; Wu-hu Lei
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Paper Abstract

Airfoil trailing vortex is an important reason for the crash, and vortex detection is the basic premise for the civil aeronautics boards to make the flight measures and protect civil aviation's security. So a new method of aircraft trailing vortex detection based on laser's multiplex information echo has been proposed in this paper. According to the classical aerodynamics theories, the formation mechanism of the trailing vortex from the airfoil wingtip has been analyzed, and the vortex model of Boeing 737 in the taking-off phase has also been established on the FLUENT software platform. Combining with the unique morphological structure characteristics of trailing vortex, we have discussed the vortex's possible impact on the frequency, amplitude and phase information of laser echo, and expounded the principle of detecting vortex based on fusing this information variation of laser echo. In order to prove the feasibility of this detecting technique, the field experiment of detecting the vortex of civil Boeing 737 by laser has been carried on. The experimental result has shown that the aircraft vortex could be found really in the laser scanning area, and its diffusion characteristic has been very similar to the previous simulation result. Therefore, this vortex detection means based on laser's multiplex information echo was proved to be practicable relatively in this paper. It will provide the detection and identification of aircraft's trailing vortex a new way, and have massive research value and extensive application prospect as well.

Paper Details

Date Published: 13 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76564J (13 October 2010); doi: 10.1117/12.865574
Show Author Affiliations
Nan-xiang Zhao, Electronic Engineering Institute (China)
Key Lab. of Electronic Restriction (China)
Yong-hua Wu, Electronic Engineering Institute (China)
Key Lab. of Electronic Restriction (China)
Yi-hua Hu, Electronic Engineering Institute (China)
Key Lab. of Electronic Restriction (China)
Wu-hu Lei, Electronic Engineering Institute (China)
Key Lab. of Electronic Restriction (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

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