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Proceedings Paper

Raman spectra of amorphous carbon films deposited by SWP
Author(s): Junqi Xu; Weiguo Liu; Lingxia Hang; Junhong Su; Huiqing Fan
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Paper Abstract

Amorphous carbon film is one of the most important anti-reflection protective films coated on infrared optical components. In this paper, hydrogen-free amorphous carbon films were deposited by new type surface-wave-sustained plasma (SWP) source with a graphite target at various experiment parameters. The laser Raman spectroscopy at wavelength of 514 nm was used to investigate the structure and bonding of these carbon films. The results showed consanguineous correlations between the intensity ratio ID/IG and the experiment parameters such as microwave power, target voltage and gas pressure applied to the SWP source. Raman spectra proved the structure of these carbon films prepared by SWP technique is typical diamond-like carbon (DLC). The analysis on G peak position and intensity ratio ID/IG indicated that Raman shifts moves to low wavenumber and ID/IG decreases with the increasing of microwave power from 150 W to 330 W. These results means the formation of sp3 bond prefers higher microwave power. DLC films prepared at target voltage of -200 V have higher sp3 content than that of -350 V, moreover, an increase of gas pressure during experiments yields higher sp3 content at the microwave power below 270 W, whereas the change of sp3 content is slight with the various conditions when microwave power exceeds 270 W.

Paper Details

Date Published: 7 October 2010
PDF: 6 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 76552L (7 October 2010); doi: 10.1117/12.865536
Show Author Affiliations
Junqi Xu, Xi'an Technological Univ. (China)
Northwestern Polytechnical Univ. (China)
Weiguo Liu, Xi'an Technological Univ. (China)
Lingxia Hang, Xi'an Technological Univ. (China)
Junhong Su, Xi'an Technological Univ. (China)
Huiqing Fan, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)

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