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Proceedings Paper

Spectrum acquisition of detonation based on CMOS
Author(s): Yan Li; Yonglin Bai; Bo Wang; Baiyu Liu; Yingdong Xue; Wei Zhang; Yongsheng Gou; Xiaohong Bai; Junjun Qin; Ouyang Xian
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Paper Abstract

The detection of high-speed dynamic spectrum is the main method to acquire transient information. In order to obtain the large amount spectral data in real-time during the process of detonation, a CMOS-based system with high-speed spectrum data acquisition is designed. The hardware platform of the system is based on FPGA, and the unique characteristic of CMOS image sensors in the rolling shutter model is used simultaneously. Using FPGA as the master control chip of the system, not only provides the time sequence for CIS, but also controls the storage and transmission of the spectral data. In the experiment of spectral data acquisition, the acquired information is transmitted to the host computer through the CameraLink bus. The dynamic spectral curve is obtained after the subsequent processing. The experimental results demonstrate that this system is feasible in the acquisition and storage of high-speed dynamic spectrum information during the process of detonation.

Paper Details

Date Published: 22 October 2010
PDF: 6 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76585C (22 October 2010); doi: 10.1117/12.865534
Show Author Affiliations
Yan Li, Xi'an Institute of Optics and Precision Mechanics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Yonglin Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Bo Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Baiyu Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Yingdong Xue, Xi'an Institute of Optics and Precision Mechanics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Wei Zhang, Xi'an Institute of Optics and Precision Mechanics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Yongsheng Gou, Xi'an Institute of Optics and Precision Mechanics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Xiaohong Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Junjun Qin, Xi'an Institute of Optics and Precision Mechanics (China)
Ouyang Xian, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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