Share Email Print
cover

Proceedings Paper

Development of the tongue coating analyzer based on concave grating monochrometer and virtual instrument
Author(s): Zhong Ren; Guodong Liu; Lvming Zeng; Zhen Huang; Wenping Zeng
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The tongue coating diagnosis is an important part in tongue diagnosis of traditional Chinese medicine (TCM).The change of the thickness and color of the tongue coating can reflect the pathological state for the patient. By observing the tongue coating, a Chinese doctor can determine the nature or severity of disease. Because some limitations existed in the tongue diagnosis method of TCM and the method based on the digital image processing, a novel tongue coating analyzer(TCA) based on the concave grating monochrometer and virtual instrument is developed in this paper. This analyzer consists of the light source system, check cavity, optical fiber probe, concave grating monochrometer, spectrum detector system based on CCD and data acquisition (DAQ) card, signal processing circuit system, computer and data analysis software based on LabVIEW, etc. Experimental results show that the novel TCA's spectral range can reach 300-1000 nm, its wavelength resolution can reach 1nm, and this TCA uses the back-split-light technology and multi-channel parallel analysis. Compared with the TCA based on the image processing technology, this TCA has many advantages, such as, compact volume, simpler algorithm, faster processing speed, higher accuracy, cheaper cost and real-time handle data and display the result, etc. Therefore, it has the greatly potential values in the fields of the tongue coating diagnosis for TCM.

Paper Details

Date Published: 22 October 2010
PDF: 6 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765830 (22 October 2010); doi: 10.1117/12.865532
Show Author Affiliations
Zhong Ren, Jiangxi Science and Technology Normal Univ. (China)
Guodong Liu, Jiangxi Science and Technology Normal Univ. (China)
Lvming Zeng, Jiangxi Science and Technology Normal Univ. (China)
Zhen Huang, Jiangxi Science and Technology Normal Univ. (China)
Wenping Zeng, Jiangxi Science and Technology Normal Univ. (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

© SPIE. Terms of Use
Back to Top