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Proceedings Paper

Hybrid phase retrieval algorithm for solving the twin image problem in in-line digital holography
Author(s): Jie Zhao; Dayong Wang; Fucai Zhang; Yunxin Wang
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Paper Abstract

For the reconstruction in the in-line digital holography, there are three terms overlapping with each other on the image plane, named the zero order term, the real image and the twin image respectively. The unwanted twin image degrades the real image seriously. A hybrid phase retrieval algorithm is presented to address this problem, which combines the advantages of two popular phase retrieval algorithms. One is the improved version of the universal iterative algorithm (UIA), called the phase flipping-based UIA (PFB-UIA). The key point of this algorithm is to flip the phase of the object iteratively. It is proved that the PFB-UIA is able to find the support of the complicated object. Another one is the Fienup algorithm, which is a kind of well-developed algorithm and uses the support of the object as the constraint among the iteration procedure. Thus, by following the Fienup algorithm immediately after the PFB-UIA, it is possible to produce the amplitude and the phase distributions of the object with high fidelity. The primary simulated results showed that the proposed algorithm is powerful for solving the twin image problem in the in-line digital holography.

Paper Details

Date Published: 11 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76560P (11 October 2010); doi: 10.1117/12.865530
Show Author Affiliations
Jie Zhao, Beijing Univ. of Technology (China)
Dayong Wang, Beijing Univ. of Technology (China)
Fucai Zhang, Univ. of Sheffield (United Kingdom)
Yunxin Wang, Beijing Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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