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Proceedings Paper

Analysis and evaluation of surface characteristics of titanium coating on diamond using combined method of wavelet and fractal
Author(s): Wenhao Du; Wenmao Yang; Tao Sun; Baorui Wang
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Paper Abstract

Nature diamond cutters are important tools to manufacture high precision optics glasses, and it is a normal method to make such cutter that soldering diamond grain with titanium coating on tool base. However, surface characteristics of titanium coating determine how much force that diamond grain joined with tool base. This paper introduces the research of surface characteristics of titanium coating on diamond grain based on AFM which uses its contacting mode to get measuring data of surface topography. Firstly, the measuring data are analyzed using 2D power spectrum algorithm to obtain spectrum energy distribution about spatial frequency. Fractal dimension is then calculated from the radius spectrum, and surface characteristics of titanium coating are evaluated using stationary wavelet transform where feature separation thresholds takes as an important role based on the fractal dimension. Coating experiments show that such method can reveal quality information of titanium coating on diamond grain comprehensively and thoroughly, thus it can offer good experimental reference to optimizing titanium coating parameters.

Paper Details

Date Published: 13 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76564D (13 October 2010); doi: 10.1117/12.865529
Show Author Affiliations
Wenhao Du, Harbin Institute of Technology (China)
Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics (China)
Wenmao Yang, Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics (China)
Tao Sun, Harbin Institute of Technology (China)
Baorui Wang, Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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