Share Email Print
cover

Proceedings Paper

Phase retrieval in situ measurement for large aperture parabolic mirror
Author(s): Lingyan Ding; Yulie Wu; Shengyi Li; Yang Liao; Yong Shu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Phase retrieval is a promising method for in-situ metrology and has been applied to spherical mirror surface metrology successfully. To meet the requirement of in-situ measurement in manufacturing large aperture parabolic mirror, a new method using phase retrieval technology is developed. In this method, an approximately parallel beam is used to illuminate the large parabolic mirror. The beam is produced by a point light source far away from the tested mirror. Then, intensity of diffraction patterns near the focus is measured by CCD. The experiment of testing a parabolic mirror with aperture 400mm and radius of curvature at vertex 2789.7mm is described. And some advices of improving the setup are presented. Errors brought by the approximately parallel beam are compensated by an algorithm derived from GS iterative algorithm. Phase retrieval result is consistent with that measured by interferometer sub-aperture stitching in error distribution, PV value and RMS value. The experiment shows that this method features simple optical path, good anti-vibration ability and acceptable accuracy.

Paper Details

Date Published: 11 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765602 (11 October 2010); doi: 10.1117/12.865524
Show Author Affiliations
Lingyan Ding, National Univ. of Defense Technology (China)
Yulie Wu, National Univ. of Defense Technology (China)
Shengyi Li, National Univ. of Defense Technology (China)
Yang Liao, National Univ. of Defense Technology (China)
Yong Shu, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top