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Proceedings Paper

Research on far-field diffraction of cube-corner retroreflector in the satellite laser ranging system
Author(s): Yin-kan Weng; Song Li; Hui Zhou; Jin-ling Yang; Guo-xing Zheng; Pin-hui Zhang
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Paper Abstract

Cube-corner retroreflector (CCR) has been widely used in the satellite laser ranging (SLR) systems as a cooperative target based on its direct reflecting. It can increase the energy of laser pulse which is reflected back from the satellite, augment the distance between the satellite and the observing station, and improve the ranging accuracy. In recent years, CCR has become one of the essential loads of satellites for improving the satellite orbit's accuracy. CCR in a satellite diffracts and redistributes the energy of the laser pulse, and the far-field diffraction of the CCR impacts the performance of SLR greatly. In this paper a method for detecting the far-field diffraction characteristics of CCR quantitatively is discussed. A measuring system is designed, some key factors, such as the incident light's collimation and the Fraunhofer transform's accuracy are analyzed and measured. And the detected results of CCR's far-field diffraction characteristics are compared with the numerical simulation, which can be used as a proof to demonstrate the correctness of the experiment. At last, the CCR's far-field diffraction characteristics at different temperatures are also observed to verify the CCR's adaptability to the space environment.

Paper Details

Date Published: 12 October 2010
PDF: 8 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76564R (12 October 2010); doi: 10.1117/12.865518
Show Author Affiliations
Yin-kan Weng, Wuhan Univ. (China)
Song Li, Wuhan Univ. (China)
Hui Zhou, Wuhan Univ. (China)
Jin-ling Yang, Wuhan Univ. (China)
Guo-xing Zheng, Wuhan Univ. (China)
Pin-hui Zhang, Wuhan Univ. (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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