Share Email Print
cover

Proceedings Paper

Kossel diffraction and conformation investigation of colloidal crystals
Author(s): Hao Yang; Chao Wang; Zhibin Sun; Song Cao; Guangjie Zhai; Ming Li
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Kossel-line diffraction method is an important way to measure the structure of crystals. Colloidal crystal is one of the hotspots on the condensed physics research. The paper investigates the kinetics process of crystallization on several hundreds nanometer particles in aqueous. In order to obtain the diffraction image, a 473nm wavelength laser is used to irradiate samples, and then the Kossel-line image of sample is projected onto the translucent screen and recorded by IEEE 1394 charge coupled device (CCD) cameras. Especially, gravity convection effects can be eliminated under microgravity environment, therefore the research of growth mechanism of colloidal crystals in the space has great scientific significance. The crystallization processes of three kinds of colloidal solution are investigated in the temperature field and electric field by means of the shear-flow assisted. Finally, laser diffraction images and white conformation images can be analyzed for exploring the phase-change rule of colloidal crystals. Besides, parameters can be adjusted online by remote control function in order to improve the flexibility of experiments.

Paper Details

Date Published: 11 October 2010
PDF: 9 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76560B (11 October 2010); doi: 10.1117/12.865504
Show Author Affiliations
Hao Yang, Ctr. for Space Science and Applied Research (China)
Chao Wang, Ctr. for Space Science and Applied Research (China)
Zhibin Sun, Ctr. for Space Science and Applied Research (China)
Song Cao, Ctr. for Space Science and Applied Research (China)
Guangjie Zhai, Ctr. for Space Science and Applied Research (China)
Ming Li, Institute of Physics (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top