Share Email Print
cover

Proceedings Paper

Nonlinearity analysis of dual-frequency laser interferometer with two longitudinal modes
Author(s): Tao Zhang; Yanhua Wu; Lu Dong
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The nonlinearity error of the dual-frequency laser interferometer with two longitudinal modes and special subsequent electrical signal processing system was studied. The expressions for the output signal pair were derived based on the theoretical analysis when the nonlinearity existed. From the above it was given that the nonlinearity makes the frequency-mixing output signals shift and undulate, and its main factors are the perfection degree of the optical system adjustment and the polarization splitting degree of the polarization beam splitter. The maximum signal shift amplitude was close to that observed on oscillograph and it could be used to estimate the perfection degree of the optical system adjustment and determine the maximum interpolation number in the subsequent signal processing stage.

Paper Details

Date Published: 11 October 2010
PDF: 8 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76562M (11 October 2010); doi: 10.1117/12.865350
Show Author Affiliations
Tao Zhang, Sichuan Univ. (China)
Yanhua Wu, Sichuan Univ. (China)
Lu Dong, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top