Share Email Print
cover

Proceedings Paper

High-accuracy two-dimensional small-angle measurement based on laser multiple-reflection
Author(s): Wen-liang Wang; Hai-bo Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A measurement method of two-dimensional small-angle is proposed in this paper. This method is based on laser diodes, dual-axis charge coupled devices (CCD) camera, and a series of reflections between two first-surface mirrors. Measurement accuracy is improved as the laser beam is reflected back and forth several times between the mirrors. Analytic ray tracing is used to model the reflected light ray so as to determine the system equations implicitly in terms of the measured angles. A 2-dimensional high-precision tunable plane mirror is used to simulate the deflection angle. The real-time position changes of the laser spot on the tunable plane mirror are recorded by means of CCD camera; and the position coordinates of all laser spots in pictures are obtained by digital image processing methods and sub-pixel weighted centroid algorithm. According to the centroid coordinate changes of laser spot, the deflection angle of the measured object is obtained. To validate the system, a prototype is built. Calibration and stability experiments are performed. Experimental results show that the resolution, accuracy, and measurement range are, respectively, 0.02, 0.1, and 720 arc sec.

Paper Details

Date Published: 11 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76561Y (11 October 2010); doi: 10.1117/12.865187
Show Author Affiliations
Wen-liang Wang, National Univ. of Defense Technology (China)
Hai-bo Liu, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top