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Proceedings Paper

Absolute realization of low BRDF value
Author(s): Zilong Liu; Ningfang Liao; Ping Li; Yu Wang
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Paper Abstract

Low BRDF value is widespread used in many critical domains such as space and military fairs. These values below 0.1 Sr-1 . So the Absolute realization of these value is the most critical issue in the absolute measurement of BRDF. To develop the Absolute value realization theory of BRDF , defining an arithmetic operators of BRDF , achieving an absolute measurement Eq. of BRDF based on radiance. This is a new theory method to solve the realization problem of low BRDF value. This theory method is realized on a self-designed common double orientation structure in space. By designing an adding structure to extend the range of the measurement system and a control and processing software, Absolute realization of low BRDF value is achieved. A material of low BRDF value is measured in this measurement system and the spectral BRDF value are showed within different angles allover the space. All these values are below 0.4 Sr-1 . This process is a representative procedure about the measurement of low BRDF value. A corresponding uncertainty analysis of this measurement data is given depend on the new theory of absolute realization and the performance of the measurement system. The relative expand uncertainty of the measurement data is 0.078. This uncertainty analysis is suitable for all measurements using the new theory of absolute realization and the corresponding measurement system.

Paper Details

Date Published: 11 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76562J (11 October 2010); doi: 10.1117/12.864900
Show Author Affiliations
Zilong Liu, Beijing Institute of Technology (China)
National Institute of Metrology (China)
Ningfang Liao, Beijing Institute of Technology (China)
Ping Li, National Institute of Metrology (China)
Yu Wang, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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