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Proceedings Paper

Defect reduction through Lean methodology
Author(s): Kathleen Purdy; Louis Kindt; Jim Densmore; Craig Benson; Nancy Zhou; John Leonard; Cynthia Whiteside; Robert Nolan; David Shanks
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Paper Abstract

Lean manufacturing is a systematic method of identifying and eliminating waste. Use of Lean manufacturing techniques at the IBM photomask manufacturing facility has increased efficiency and productivity of the photomask process. Tools, such as, value stream mapping, 5S and structured problem solving are widely used today. In this paper we describe a step-by-step Lean technique used to systematically decrease defects resulting in reduced material costs, inspection costs and cycle time. The method used consists of an 8-step approach commonly referred to as the 8D problem solving process. This process allowed us to identify both prominent issues as well as more subtle problems requiring in depth investigation. The methodology used is flexible and can be applied to numerous situations. Advantages to Lean methodology are also discussed.

Paper Details

Date Published: 24 September 2010
PDF: 9 pages
Proc. SPIE 7823, Photomask Technology 2010, 78231Y (24 September 2010); doi: 10.1117/12.864524
Show Author Affiliations
Kathleen Purdy, IBM Corp. (United States)
Louis Kindt, IBM Corp. (United States)
Jim Densmore, IBM Corp. (United States)
Craig Benson, IBM Corp. (United States)
Nancy Zhou, IBM Corp. (United States)
John Leonard, IBM Corp. (United States)
Cynthia Whiteside, IBM Corp. (United States)
Robert Nolan, IBM Corp. (United States)
David Shanks, IBM Corp. (United States)

Published in SPIE Proceedings Vol. 7823:
Photomask Technology 2010
M. Warren Montgomery; Wilhelm Maurer, Editor(s)

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