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Proceedings Paper

Analyzing the emission self-organized structure in gas discharge by photoelectric detect method
Author(s): Shuhua Liu; Fan Yang; Jianmin Song; Yanxia Gu; Lingxin Zhu; Hengxin Ma
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Paper Abstract

In gas discharge, various self-organized structures are formed as the applied voltage is increased. A noticeable phenomenon is that the system undergoes twice hexagon structure. One is observed in the lower voltage range and the other is in the higher voltage range. To study the intrinsic mechanism, the light signal, electric signal, and the emission spectrum of the two hexagons is measured by photoelectric detect method. The electric signal is detected by high-voltage probe. The light signal is measured distinguished in time and space by using diaphragm. The electron excitation temperature is measured using spectrum method. It is conclude that the forming mechanism of the two kinds of hexagon is different. The lower-voltage hexagon is a dynamic multiplex structure, while the higher-voltage hexagon is a single static structure. The excitation temperature of higher-voltage hexagon is higher than that of lower-voltage hexagon.

Paper Details

Date Published: 22 October 2010
PDF: 5 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76581X (22 October 2010); doi: 10.1117/12.864434
Show Author Affiliations
Shuhua Liu, Agricultural Univ. of Hebei (China)
Fan Yang, Agricultural Univ. of Hebei (China)
Jianmin Song, Agricultural Univ. of Hebei (China)
Yanxia Gu, Agricultural Univ. of Hebei (China)
Lingxin Zhu, Agricultural Univ. of Hebei (China)
Hengxin Ma, Agricultural Univ. of Hebei (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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