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Proceedings Paper

Research on integrating sphere low-light level stress system
Author(s): Donglin Yang; Dawei Feng
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Paper Abstract

Low-light level night vision device must be assessed by light stress reliability test in the design approval testing and production approval testing. The low-light level stress environment is the key to light stress reliability test on Low-light level night vision device. This paper studies the actual working environment of Low-light level night vision device from the aspects of night sky spectrum of nature light and illumination, and designs a low-light level stress system. The system consists of double-integrating-sphere light source, light stress automatic switching device, collimator, monitoring and control system for light stress. The system uses a total light source with radiation structure to improve the light efficiency, solve the question of light stress consistency, achieve a typical night-day simulation of the environment and the monitoring and control of the whole process.

Paper Details

Date Published: 11 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563F (11 October 2010); doi: 10.1117/12.864422
Show Author Affiliations
Donglin Yang, Changchun Univ. of Science and Technology (China)
Dawei Feng, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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