Share Email Print
cover

Proceedings Paper

New phase measurement method for laser rangefinder
Author(s): Wen-jun Sun; Jing-nan Sun; Wen-bin Bu; Zhong Meng
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new phase measurement method is designed and presented by using the technique of signal shifting phase and the technique of signal multiplication for laser rangefinder. The intensity of laser light is modulated by cosine circuit signal, at the same time the cosine circuit signal is thansformed sine signal by the shifting phase technique. Two signals mentioned above are multiplied by received signal from the target respectively, then being transmitted into signal processor after passing through low band filter respectively. The result of phase-shift between the received signal and sent signal is calculated by means of signal processor and time-counter with double frequency of modulation signal. The proposed system is composed of four units such as control and count unit, emitting and receiving unit of laser light, signal processing unit and result display unit. The two most advantages of proposed system over others are its ability of proper isolation which reduces crosstalk and its independency thermal drift. Theoretical calculations and experimental results have shown the accuracy better than 2 mm.

Paper Details

Date Published: 12 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76565X (12 October 2010); doi: 10.1117/12.864299
Show Author Affiliations
Wen-jun Sun, Harbin Normal Univ. (China)
Jing-nan Sun, Harbin Normal Univ. (China)
Wen-bin Bu, Harbin Normal Univ. (China)
Zhong Meng, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top