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Proceedings Paper

Application of semiconductor laser on big dimension measuring system
Author(s): Hongtao Zhang; Xuhua Zhai; Zhou Qu; Hong Zhang
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Paper Abstract

The structure and principles of an optical non-contact measuring system of large-dimension diameter were analyzed detailed in the paper. This system can be used to measure up to the diameter of 2200 millimeters. And it also can be used to measure the coaxiality of inner and outside of cirque. Moreover, the system can realize measure on-line parameters in processing. The ultimate errors in measuring large-dimension diameter are less than 0.02 millimeters.

Paper Details

Date Published: 11 October 2010
PDF: 5 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765623 (11 October 2010); doi: 10.1117/12.864295
Show Author Affiliations
Hongtao Zhang, Changchun Institute of Engineering and Technology (China)
Xuhua Zhai, Changchun Institute of Engineering and Technology (China)
Zhou Qu, Changchun Institute of Engineering and Technology (China)
Hong Zhang, Changchun Institute of Engineering and Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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