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Proceedings Paper

Measurement of refractive indices and optical axis of a uniaxial crystal assisted by Brewster angle and reflectivity fitting techniques
Author(s): J. H. Xing
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Paper Abstract

The refractive indices along arbitrary wave vector are analyzed in a uniaxial crystal with buried optical axis. According to the Brewster angle law, the relations between the Brewster angles of the incident p-polarized light and the two principal refractive indices are obtained for the case that the optical axis is in the incident plane. Further, for the case of unknown optical axis, the two principal refractive indices and the direction of optical axis can be calculated by inserting the experimental Brewster angles into the specially derived equations. On the other hand, the functions for the reflectivity fitting corresponding to two cases, i.e. , s-polarized light and p-polarized light, are presented. Finally, the CaCO3 crystal has been measured both in s-polarized light and p-polarized light with a view to carefully study the effect of incident angle on reflectivity. The accuracy of our measurement is able to reach 0.0001 without the need of any machining process on the sample.

Paper Details

Date Published: 11 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76561P (11 October 2010); doi: 10.1117/12.864200
Show Author Affiliations
J. H. Xing, Changshu Institute of Technology (China)
Nanjing Univ. (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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