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Proceedings Paper

Integrated localized surface plasmon resonance spectral measurement and refractive index sensing using patterned metallic nanostructures
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Date Published:
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Proc. SPIE 7766, Nanostructured Thin Films III, 77660S; doi: 10.1117/12.864072
Show Author Affiliations
Hai Sheng Leong, The Univ. of Alabama in Huntsville (United States)
Junpeng Guo, The Univ. of Alabama in Huntsville (United States)
Yongbin Lin, The Univ. of Alabama in Huntsville (United States)
Robert G. Lindquist, The Univ. of Alabama in Huntsville (United States)
David John Brady, Duke Univ. (United States)


Published in SPIE Proceedings Vol. 7766:
Nanostructured Thin Films III
Raúl J. Martin-Palma; Yi-Jun Jen; Akhlesh Lakhtakia, Editor(s)

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