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Proceedings Paper

New method for testing diffraction efficiency of AOTF
Author(s): Yuanting Shen; Shiji Yang; Zhiping He
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Paper Abstract

In view of characteristics of electronically tunable dispersion and staring imaging, imaging spectrometer based on acousto-optic tunable filters (AOTF) has become one of the main technical means of extraterrestrial substance detection all over the world. Diffraction efficiency as one of the main properties of AOTF which is used as a dispersive element in CE-3 Infrared Imaging Spectrometer affects the system's SNR directly. Therefore, it is particularly important to test diffraction efficiency of AOTF. There are some limitations for two testing methods existing which are the use of tungsten halogen lamp with spectrometer and the use of fixed-wavelength laser with power meter. This paper proposes a new method, namely the combination of tunable laser system with energy meters. Nanosecond tunable laser system produces pulsed continuous wavelength tunable laser beams as the testing source, which can support full-band measurement. Besides, beam splitter producing reference beams can reduce the impact of pulsed energy instability. Ratio of diffraction energy and reference energy is considered as the diffraction part while radio frequency (RF) is on. And ratio of direct transmission energy of AOTF and reference energy takes the place of the transmission part while RF is off. The ratio of both is defined as diffraction efficiency. This paper describes the installation based on the new testing method mentioned. Based on the analysis of the test results, it shows that the new testing method is a very practical testing method for diffraction efficiency of AOTF.

Paper Details

Date Published: 11 October 2010
PDF: 8 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76562R (11 October 2010); doi: 10.1117/12.864041
Show Author Affiliations
Yuanting Shen, Shanghai Institute of Technical Physics (China)
Shiji Yang, Shanghai Institute of Technical Physics (China)
Zhiping He, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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