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Proceedings Paper

Modal analysis of low-level-light aiming sight-glass based on shock testing conditions
Author(s): Youtang Gao; Huan Ding; Xiao Xue; Yuan Xu; Benkang Chang
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Paper Abstract

Low-level-light ( LLL ) aiming sight-glass measurement technologies based on multiple circumstances testing conditions are always concerned by military equipments manufacturers. The article puts forward the concrete steps and method of shock circumstances testing measurement according to military optical equipments circumstances testing standard. Using shock theory and mathematical modeling analysis, shock model of LLL aiming sight-glass based on shock testing conditions is constructed and analyzed. Without considering resistances and under instantaneous half-sine shock pulse, the ratio of system response amplitude and half-sine pulse peak value is related to system inherent characteristic (inherent frequency, cycle T, etc.) and shock pulse duration D. The results indicate that given D/T⪆ 10.5, / 1 max / A = , half-sine shock pulse is transmitted by 1:1. Testing device response acceleration is equal to shock pulse peak acceleration. Testing device response is more intense under this condition. LLL aiming sight-glass structural performance and reticle zero point moving are influenced. Optical lens offset of LLL aiming sight-glass testing parts is impacted. Optical path parameters change and light transmission is influenced. What is more serious is that objective lens will be broken due to shock pulse transmission.

Paper Details

Date Published: 11 October 2010
PDF: 5 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76562S (11 October 2010); doi: 10.1117/12.863915
Show Author Affiliations
Youtang Gao, Nanyang Institute of Technology (China)
Nanjing Univ. of Science and Technology (China)
Huan Ding, Nanyang Institute of Technology (China)
Xiao Xue, Nanyang Institute of Technology (China)
Yuan Xu, Nanyang Institute of Technology (China)
Benkang Chang, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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