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Proceedings Paper

Application of wavelet analysis in laser Doppler vibration signal denoising
Author(s): Yu-fei Lan; Hui-feng Xue; Xin-liang Li; Dan Liu
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Paper Abstract

Large number of experiments show that, due to external disturbances, the measured surface is too rough and other factors make use of laser Doppler technique to detect the vibration signal contained complex information, low SNR, resulting in Doppler frequency shift signals unmeasured, can not be demodulated Doppler phase and so on. This paper first analyzes the laser Doppler signal model and feature in the vibration test, and studies the most commonly used three ways of wavelet denoising techniques: the modulus maxima wavelet denoising method, the spatial correlation denoising method and wavelet threshold denoising method. Here we experiment with the vibration signals and achieve three ways by MATLAB simulation. Processing results show that the wavelet modulus maxima denoising method at low laser Doppler vibration SNR, has an advantage for the signal which mixed with white noise and contained more singularities; the spatial correlation denoising method is more suitable for denoising the laser Doppler vibration signal which noise level is not very high, and has a better edge reconstruction capacity; wavelet threshold denoising method has a wide range of adaptability, computational efficiency, and good denoising effect. Specifically, in the wavelet threshold denoising method, we estimate the original noise variance by spatial correlation method, using an adaptive threshold denoising method, and make some certain amendments in practice. Test can be shown that, compared with conventional threshold denoising, this method is more effective to extract the feature of laser Doppler vibration signal.

Paper Details

Date Published: 11 October 2010
PDF: 8 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765609 (11 October 2010); doi: 10.1117/12.863866
Show Author Affiliations
Yu-fei Lan, Northwestern Polytechnical Univ. (China)
Hui-feng Xue, Northwestern Polytechnical Univ. (China)
Xin-liang Li, AVIC Changcheng Institute of Metrology & Measurement (China)
Dan Liu, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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