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Proceedings Paper

Thermoreflectance and multimode imaging for defect location in silicon solar cells
Author(s): Lawrence Domash; Kevin McCarthy; Qiaoer Zhou; Kadhair Al-Hemyari; Xiaolin Hu; Janice Hudgings
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Paper Abstract

Silicon solar cells suffer from defects such as microcracks and shunts that limit performance and reliability. We describe a new family of imaging techniques, including lock-in thermoreflectance and mechanoreflectance, which offer much higher spatial resolution and lower cost than current methods for inspection of solar cells. These techniques are based on advanced image processing algorithms for detection of very small variations in optical reflectance, using ordinary visible light CCD cameras. The image data can be merged with conventional techniques such as electroluminescence, in one camera system. Experimental results and comparison with conventional techniques for evaluation of solar cells are presented.

Paper Details

Date Published: 19 August 2010
PDF: 10 pages
Proc. SPIE 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III, 77730A (19 August 2010); doi: 10.1117/12.863783
Show Author Affiliations
Lawrence Domash, Alenas Imaging Inc. (United States)
Kevin McCarthy, Alenas Imaging Inc. (United States)
Mount Holyoke College (United States)
Qiaoer Zhou, Alenas Imaging Inc. (United States)
Univ. of California, Santa Cruz (United States)
Kadhair Al-Hemyari, Mount Holyoke College (United States)
Xiaolin Hu, Mount Holyoke College (United States)
Janice Hudgings, Alenas Imaging Inc. (United States)
Mount Holyoke College (United States)


Published in SPIE Proceedings Vol. 7773:
Reliability of Photovoltaic Cells, Modules, Components, and Systems III
Neelkanth G. Dhere; John H. Wohlgemuth; Kevin Lynn, Editor(s)

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