Share Email Print
cover

Proceedings Paper

Multi-camera calibration based on openCV and multi-view registration
Author(s): Xiao-ming Deng; Xiong Wan; Zhi-min Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

For multi-camera calibration systems, a method based on OpenCV and multi-view registration combining calibration algorithm is proposed. First of all, using a Zhang's calibration plate (8X8 chessboard diagram) and a number of cameras (with three industrial-grade CCD) to be 9 group images shooting from different angles, using OpenCV to calibrate the parameters fast in the camera. Secondly, based on the corresponding relationship between each camera view, the computation of the rotation matrix and translation matrix is formulated as a constrained optimization problem. According to the Kuhn-Tucker theorem and the properties on the derivative of the matrix-valued function, the formulae of rotation matrix and translation matrix are deduced by using singular value decomposition algorithm. Afterwards an iterative method is utilized to get the entire coordinate transformation of pair-wise views, thus the precise multi-view registration can be conveniently achieved and then can get the relative positions in them(the camera outside the parameters).Experimental results show that the method is practical in multi-camera calibration .

Paper Details

Date Published: 11 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765624 (11 October 2010); doi: 10.1117/12.863359
Show Author Affiliations
Xiao-ming Deng, Nanchang Hangkong Univ. (China)
Xiong Wan, Nanchang Hangkong Univ. (China)
Zhi-min Zhang, Nanchang Hangkong Univ. (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top