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Proceedings Paper

Update on blocked impurity band detector technology from DRS
Author(s): H. Hogue; E. Atkins; D. Reynolds; M. Salcido; L. Dawson; D. Molyneux; M. Muzilla
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Paper Abstract

The Blocked Impurity Band (BIB) detector technology team at DRS Sensors and Targeting Systems specializes in providing the highest performance, broadest application range of BIB detector products. These include detectors, Focal Plane Arrays (FPA), and sensor assemblies for ground, airborne and space applications. We offer flight proven low flux Si:As and Si:Sb FPAs in square formats up to 1024x1024. We also offer high-flux FPA systems for ground-based telescopes and airborne applications in several square and rectangular formats, such as 160×640 sensors for push-broom spatial-spectral imaging. NASA's Wide-field Infrared Survey Explorer mission selected DRS 1024×1024 arrays for its the 12 and 24 micron wavelength bands. The Spitzer Space Telescope utilizes DRS 128×128 Si:As and Si:Sb FPAs, and 1024×1024 Si:Sb arrays are being fabricated by DRS for an upgrade to the SOFIA FORCAST instrument. DRS is unique in providing detectors and FPAs in alternate detector materials such as Si:Sb, Si:Ga, and Si:P to optimize wavelength range vs operating temperature. Sensor assemblies include detectors or FPAs packaged with cryogenic cabling and electronics and ambient temperature drive and data acquisition electronics--fully tested, and environmentally qualified. DRS is also unique in extending its conventional BIB detector product line to include novel detector architectures for a variety of applications. Si:As detectors with avalanche gain (~40,000X) function as number-mode photon counters at visible or mid-infrared wavelengths. A recent DRS innovation is the extension of Si:As BIB detectors designs to achieve wavelength extension into the far-infrared (low THz) wavelength region. Wavelength extension to ~50 microns (6 THz) has been demonstrated, with further extension to at least ~100 microns (3 THz) in progress.

Paper Details

Date Published: 2 September 2010
PDF: 10 pages
Proc. SPIE 7780, Detectors and Imaging Devices: Infrared, Focal Plane, Single Photon, 778004 (2 September 2010); doi: 10.1117/12.862708
Show Author Affiliations
H. Hogue, DRS Sensors & Targeting Systems, Inc. (United States)
E. Atkins, DRS Sensors & Targeting Systems, Inc. (United States)
D. Reynolds, DRS Sensors & Targeting Systems, Inc. (United States)
M. Salcido, DRS Sensors & Targeting Systems, Inc. (United States)
L. Dawson, DRS Sensors & Targeting Systems, Inc. (United States)
D. Molyneux, DRS Sensors & Targeting Systems, Inc. (United States)
M. Muzilla, DRS Sensors & Targeting Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 7780:
Detectors and Imaging Devices: Infrared, Focal Plane, Single Photon
Eustace L. Dereniak; Randolph E. Longshore; Manijeh Razeghi; John P. Hartke; Ashok K. Sood; Paul D. LeVan, Editor(s)

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