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Proceedings Paper

Determination of refractive index of transparent plate by Fabry-Perot fringe analysis
Author(s): Hee Joo Choi; Hwan Hong Lim; Han Seb Moon; Tae Bong Eom; Jung J. Ju; Myoungsik Cha
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Paper Abstract

We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2π- ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10-5 for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.

Paper Details

Date Published: 3 August 2010
PDF: 6 pages
Proc. SPIE 7790, Interferometry XV: Techniques and Analysis, 77900Z (3 August 2010); doi: 10.1117/12.862363
Show Author Affiliations
Hee Joo Choi, Pusan National Univ. (Korea, Republic of)
Hwan Hong Lim, Pusan National Univ. (Korea, Republic of)
Han Seb Moon, Pusan National Univ. (Korea, Republic of)
Tae Bong Eom, Korea Research Institute of Standards and Science (Korea, Republic of)
Jung J. Ju, Electronics and Telecommunications Research Institute (Korea, Republic of)
Myoungsik Cha, Pusan National Univ. (Korea, Republic of)

Published in SPIE Proceedings Vol. 7790:
Interferometry XV: Techniques and Analysis
Catherine E. Towers; Joanna Schmit; Katherine Creath, Editor(s)

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