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Proceedings Paper

Simultaneous measurement of spectral reflectivity and birefringence of a stone surface using polarization phase-shifting interferometer
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Paper Abstract

We aim to develop a method for distinguishing quality of stone artifacts. A value of stone artifacts depends on the polishing quality of the surface. However, it is difficult to evaluate quantitatively and its evaluation is performed by sensibility of experts. According to a theory, experts can sense a minute difference of optical characteristic of polished stone surface. We propose a simultaneous measurement of spectral reflectivity and birefringence of polished stone surface using the polarization phase-shifting interferometer. In the polarization phase-shifting interferometry, the phase-shifter gives a phase difference between perpendicular polarized beams. This phase difference can be considered the optical retardation. When the linearly polarized beam passes though a sample which has birefringence, the initial phase of interferogram is shifted. Thus, retardations in each wavelength can be calculated by Fourier analyzing a interferogram. First, we constructed a coaxial illumination type optical system for verification experiments. As a result, we confirmed the reflected light from surface is stronger than light from inner. Therefore, it cannot measure inner reflected light which has valuable optical characteristics. Based on these results, we improved the illumination method of optical system to oblique illumination. Finally, we can obtain the 2-dimentional spectral reflectivity and birefringence characteristics.

Paper Details

Date Published: 3 August 2010
PDF: 8 pages
Proc. SPIE 7790, Interferometry XV: Techniques and Analysis, 77900Y (3 August 2010); doi: 10.1117/12.862267
Show Author Affiliations
H. Kobayashi, Kagawa Univ. (Japan)
I. Ishimaru, Kagawa Univ. (Japan)


Published in SPIE Proceedings Vol. 7790:
Interferometry XV: Techniques and Analysis
Catherine E. Towers; Joanna Schmit; Katherine Creath, Editor(s)

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