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Proceedings Paper

Polar decomposition applied to light scattering by structured 2D surfaces
Author(s): J. M. Sanz; J. M. Saiz; F. Moreno; F. González
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Paper Abstract

A set of light-scattering results is presented in the form of Mueller Matrices (MM) and their corresponding Polar Decomposition (PD) parameters. The system under analysis is a square microstructure on a flat substrate, in the form of either a rib or a groove (or several equally spaced, depending on the experiment). As it is well known, MM contains all information, and many works have been carried out trying to connect its properties with those of the scattering system. However, this is not as intuitive as the analysis allowed by other presentations of the results, based on the decomposition of MM matrix in a set of matrices, each representing the action of a particular (non-real) element, and acting sequentially on the incident beam. Our analysis is a quite conventional application of the Polar Decomposition. The resulting parameters reveal, for instance, that the substrate plays an important role in the origin of the depolarization. Concerning the polar components the main analysis is performed by means of the conventional diattenuation and retardance parameters. The number and position of the discontinuities in the retardation parameter is associated to the size of the defect. This, of course, can be also concluded from the observation of m00 element oscillations, but in the case of the PD retardation parameter it is possible to connect the geometrical shape of the scattering element (rib or groove) to a single condition established for the PD parameters.

Paper Details

Date Published: 20 August 2010
PDF: 7 pages
Proc. SPIE 7792, Reflection, Scattering, and Diffraction from Surfaces II, 779203 (20 August 2010); doi: 10.1117/12.862257
Show Author Affiliations
J. M. Sanz, Univ. de Cantabria (Spain)
J. M. Saiz, Univ. de Cantabria (Spain)
F. Moreno, Univ. de Cantabria (Spain)
F. González, Univ. de Cantabria (Spain)

Published in SPIE Proceedings Vol. 7792:
Reflection, Scattering, and Diffraction from Surfaces II
Zu-Han Gu; Leonard M. Hanssen, Editor(s)

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