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Proceedings Paper

Survey of interferometric techniques used to test JWST optical components
Author(s): H. Philip Stahl; Chris Alongi; Andrea Arneson; Rob Bernier; Bob Brown; Dave Chaney; Glen Cole; Jay Daniel; Lee Dettmann; Ron Eng; Ben Gallagher; Robert Garfield; James Hadaway; Patrick Johnson; Allen Lee; Doug Leviton; Adam Magruder; Michael Messerly; Ankit Patel; Pat Reardon; John Schwenker; Martin Seilonen; Koby Smith; W. Scott Smith
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Paper Abstract

JWST optical component in-process optical testing and cryogenic requirement compliance certification, verification & validation is probably the most difficult metrology job of our generation in astronomical optics. But, the challenge has been met: by the hard work of dozens of optical metrologists; the development and qualification of multiple custom test setups; and several new inventions, including 4D PhaseCam and Leica Absolute Distance Meter. This paper summarizes the metrology tools, test setups and processes used to characterize the JWST optical components.

Paper Details

Date Published: 2 August 2010
PDF: 13 pages
Proc. SPIE 7790, Interferometry XV: Techniques and Analysis, 779002 (2 August 2010); doi: 10.1117/12.862234
Show Author Affiliations
H. Philip Stahl, NASA Marshall Space Flight Ctr. (United States)
Chris Alongi, L-3 Communications Tinsley Labs. Inc. (United States)
Andrea Arneson, L-3 Communications Tinsley Labs. Inc. (United States)
Rob Bernier, L-3 Communications Tinsley Labs. Inc. (United States)
Bob Brown, Ball Aerospace Technology Corp. (United States)
Dave Chaney, Ball Aerospace Technology Corp. (United States)
Glen Cole, NASA Contract Assurance Services (United States)
Jay Daniel, L-3 Communications Tinsley Labs. Inc. (United States)
Lee Dettmann, L-3 Communications Tinsley Labs. Inc. (United States)
Ron Eng, NASA Marshall Space Flight Ctr. (United States)
Ben Gallagher, Ball Aerospace Technology Corp. (United States)
Robert Garfield, L-3 Communications Tinsley Labs. Inc. (United States)
James Hadaway, The Univ. of Alabama in Huntsville (United States)
Patrick Johnson, L-3 Communications Tinsley Labs. Inc. (United States)
Allen Lee, L-3 Communications Tinsley Labs. Inc. (United States)
Doug Leviton, NASA Goddard Space Flight Ctr. (United States)
Adam Magruder, L-3 Communications Tinsley Labs. Inc. (United States)
Michael Messerly, Lawrence Livermore National Lab. (United States)
Ankit Patel, L-3 Communications Tinsley Labs. Inc. (United States)
Pat Reardon, The Univ. of Alabama in Huntsville (United States)
John Schwenker, Ball Aerospace Technology Corp. (United States)
Martin Seilonen, L-3 Communications Tinsley Labs. Inc. (United States)
Koby Smith, Ball Aerospace Technology Corp. (United States)
W. Scott Smith, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 7790:
Interferometry XV: Techniques and Analysis
Catherine E. Towers; Joanna Schmit; Katherine Creath, Editor(s)

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