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Proceedings Paper

Comparison of measured and analytical ultraviolet light attenuation
Author(s): Jack T. Sanders
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Paper Abstract

Ultraviolet light attenuation was measured by the Martin Marietta Corporation in 1980 between the wavelengths of approximately 115 nanometers to 300 nanometers. These data are compared to the light attenuation calculated using x-ray interactions with matter, pioneered by the Lawrence Berkley National Laboratories. The Center for X-Ray Optics provides a methodology to calculate light attenuation from x-ray light to 124-nm ultraviolet light. There is a slight overlap in the data, allowing for a comparison of commonly outgassed species from the base materials reported in the Martin Marietta document.

Paper Details

Date Published: 7 September 2010
PDF: 5 pages
Proc. SPIE 7794, Optical System Contamination: Effects, Measurements, and Control 2010, 77940R (7 September 2010); doi: 10.1117/12.862165
Show Author Affiliations
Jack T. Sanders, ATK Space Systems (United States)

Published in SPIE Proceedings Vol. 7794:
Optical System Contamination: Effects, Measurements, and Control 2010
Sharon A. Straka; Nancy Carosso, Editor(s)

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