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Proceedings Paper

Data-constrained microstructure modeling with multi-spectrum x-ray CT
Author(s): Y. S. Yang; A. M. Tulloh; T. Muster; A. Trinchi; S. C. Mayo; S. W. Wilkins
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Paper Abstract

Conventional X-ray CT is not usually sufficient to determine microscopic compositional distributions. A dataconstrained microstructure modeling (DCM) methodology has been developed which uses multiple CT data sets acquired with different X-ray spectra, and incorporates them as model constraints. The DCM approach has been applied to predict the distributions of corrosion inhibitor and filler in a polymer matrix. The DCM-predicted compositional microstructures have a reasonable agreement with EDX images taken on the sample surface.

Paper Details

Date Published: 2 September 2010
PDF: 9 pages
Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040N (2 September 2010); doi: 10.1117/12.861964
Show Author Affiliations
Y. S. Yang, Commonwealth Scientific and Industrial Research Organisation (Australia)
A. M. Tulloh, Commonwealth Scientific and Industrial Research Organisation (Australia)
T. Muster, Commonwealth Scientific and Industrial Research Organisation (Australia)
A. Trinchi, Commonwealth Scientific and Industrial Research Organisation (Australia)
S. C. Mayo, Commonwealth Scientific and Industrial Research Organisation (Australia)
S. W. Wilkins, Commonwealth Scientific and Industrial Research Organisation (Australia)


Published in SPIE Proceedings Vol. 7804:
Developments in X-Ray Tomography VII
Stuart R. Stock, Editor(s)

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