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Proceedings Paper

Propagation of a Gaussian beam through a stack of positive and negative refractive index materials
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Paper Abstract

Propagation of a monochromatic Gaussian beam through a stack of alternating layers of positive-refractive-index dielectrics and negative-refractive-index metamaterials is analyzed using paraxial ray-optics approach. Expressions for the change of the spot-size of the Gaussian beam are derived. Sensors for measuring parameters that affect the thickness or refractive index of the metamaterials can be developed based on the change of the spot-size.

Paper Details

Date Published: 11 September 2010
PDF: 6 pages
Proc. SPIE 7754, Metamaterials: Fundamentals and Applications III, 775415 (11 September 2010); doi: 10.1117/12.861948
Show Author Affiliations
Anjan Ghosh, The Univ. of Oklahoma, Tulsa (United States)
Pramode Verma, The Univ. of Oklahoma, Tulsa (United States)
Partha P. Banerjee, Univ. of Dayton (United States)
Rola Aylo, Univ. of Dayton (United States)

Published in SPIE Proceedings Vol. 7754:
Metamaterials: Fundamentals and Applications III
Allan D. Boardman; Nader Engheta; Mikhail A. Noginov; Nikolay I. Zheludev, Editor(s)

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