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Proceedings Paper

Compact spectrometer for the analysis of high harmonics content of extreme-ultraviolet free-electron-laser radiation
Author(s): F. Frassetto; S. Coraggia; L. Poletto; N. Guerassimova; S. Dziarzhytski; E. Ploenjes; H. Weigelt
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Paper Abstract

We present the design and characterization of the spectrometer to be used at the FLASH facility (DESY, Hamburg) to characterize the spectral properties of free-electron-laser radiation in terms of high harmonics content. The spectrometer is sensitive in the 2-40 nm region. The optical design consists of two spherical gratings with variable groove spacing and a extreme-ultraviolet-enhanced CCD detector. The instrument design and characterization are presented.

Paper Details

Date Published: 27 August 2010
PDF: 8 pages
Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 780209 (27 August 2010); doi: 10.1117/12.861615
Show Author Affiliations
F. Frassetto, Istituto di Fotonica e Nanotecnologie-CNR (Italy)
S. Coraggia, Istituto di Fotonica e Nanotecnologie-CNR (Italy)
L. Poletto, Istituto di Fotonica e Nanotecnologie-CNR (Italy)
N. Guerassimova, Deutsches Elektronen-Synchrotron (Germany)
S. Dziarzhytski, Deutsches Elektronen-Synchrotron (Germany)
E. Ploenjes, Deutsches Elektronen-Synchrotron (Germany)
H. Weigelt, Deutsches Elektronen-Synchrotron (Germany)


Published in SPIE Proceedings Vol. 7802:
Advances in X-Ray/EUV Optics and Components V
Shunji Goto; Ali M. Khounsary; Christian Morawe, Editor(s)

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