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Proceedings Paper

Determination of strain fields in porous shape memory alloys using micro-computed tomography
Author(s): Therese Bormann; Sebastian Friess; Michael de Wild; Ralf Schumacher; Georg Schulz; Bert Müller
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Paper Abstract

Shape memory alloys (SMAs) belong to 'intelligent' materials since the metal alloy can change its macroscopic shape as the result of the temperature-induced, reversible martensite-austenite phase transition. SMAs are often applied for medical applications such as stents, hinge-less instruments, artificial muscles, and dental braces. Rapid prototyping techniques, including selective laser melting (SLM), allow fabricating complex porous SMA microstructures. In the present study, the macroscopic shape changes of the SMA test structures fabricated by SLM have been investigated by means of micro computed tomography (μCT). For this purpose, the SMA structures are placed into the heating stage of the μCT system SkyScan 1172™ (SkyScan, Kontich, Belgium) to acquire three-dimensional datasets above and below the transition temperature, i.e. at room temperature and at about 80°C, respectively. The two datasets were registered on the basis of an affine registration algorithm with nine independent parameters - three for the translation, three for the rotation and three for the scaling in orthogonal directions. Essentially, the scaling parameters characterize the macroscopic deformation of the SMA structure of interest. Furthermore, applying the non-rigid registration algorithm, the three-dimensional strain field of the SMA structure on the micrometer scale comes to light. The strain fields obtained will serve for the optimization of the SLM-process and, more important, of the design of the complex shaped SMA structures for tissue engineering and medical implants.

Paper Details

Date Published: 3 September 2010
PDF: 9 pages
Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78041M (3 September 2010); doi: 10.1117/12.861386
Show Author Affiliations
Therese Bormann, Univ. Basel (Switzerland)
Univ. of Applied Sciences, Northwestern Switzerland (Switzerland)
Sebastian Friess, Gloor Instruments AG (Switzerland)
Michael de Wild, Univ. of Applied Sciences, Northwestern Switzerland (Switzerland)
Ralf Schumacher, Univ. of Applied Sciences, Northwestern Switzerland (Switzerland)
Georg Schulz, Univ. Basel (Switzerland)
Bert Müller, Univ. Basel (Switzerland)


Published in SPIE Proceedings Vol. 7804:
Developments in X-Ray Tomography VII
Stuart R. Stock, Editor(s)

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