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Proceedings Paper

Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules
Author(s): R. Meier; F. Kraemer; S. Wiese; K.-J. Wolter; J. Bagdahn
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Paper Abstract

Solar module lifetime is limited by the fatigue behavior of its cell interconnectors: the copper-ribbons. Every change in temperature induces thermo-mechanical stresses in the module components due to their thermo-mechanical mismatch. The purpose of this work is to quantify this load on the copper-ribbons between the individual cells of a cell string during a thermal cycling test by measuring cell displacement using digital image correlation and to compare the results to finite element analysis (FEM). Furthermore with help of FEM the influences of different materials were investigated, allowing material and layout optimizations with respect to copper-ribbon loading.

Paper Details

Date Published: 19 August 2010
PDF: 8 pages
Proc. SPIE 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III, 777312 (19 August 2010); doi: 10.1117/12.861350
Show Author Affiliations
R. Meier, Fraunhofer Ctr. for Silicon Photovoltaics (Germany)
F. Kraemer, Fraunhofer Ctr. for Silicon Photovoltaics (Germany)
S. Wiese, Fraunhofer Ctr. for Silicon Photovoltaics (Germany)
K.-J. Wolter, Technische Univ. Dresden (Germany)
J. Bagdahn, Fraunhofer Ctr. for Silicon Photovoltaics (Germany)


Published in SPIE Proceedings Vol. 7773:
Reliability of Photovoltaic Cells, Modules, Components, and Systems III
Neelkanth G. Dhere; John H. Wohlgemuth; Kevin Lynn, Editor(s)

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