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Proceedings Paper

Magnetic measurement of pulsed laser-induced nanomagnetic arrays using Surface Magneto-Optic Kerr Effect
Author(s): N. Shirato; H. Krishna; A. K. Gangopadhyay; R. Kalyanaraman
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Paper Abstract

Efficient and dependable characterization methods of magnetic-plasmonic nanostructures are essential towards the implementation of new nanoscale materials in magneto-optical applications. Surface magneto-optic Kerr effect (SMOKE) is a powerful characterization technique, because of its simplicity and high sensitive to even monolayer thick magnetic materials. It relies on the measurement of polarization and absorption changes of reflected light in the presence of a magnetic field. While SMOKE has been applied in the past to investigate the magnetic information of continuous films, there is little work on applying it to characterize arrays of nanoparticles with variable magnetic and optical properties. Here, we have used it to investigate the magnetic behavior of nanoparticle arrays made by nanosecond pulsed laser self-organization. This technique produces an array of single-domain magnetic nanoparticles with size-dependent magnetic orientation. Nanoparticle arrays of Co and Ni were prepared on SiO2 substrates. SMOKE measurements were performed for a variety of different particle sizes and material. Systematic differences in saturation and coercivity were observed for the different samples. These results demonstrated that SMOKE is a reliable technique to rapidly characterize the magnetic behavior of nanoparticle arrays.

Paper Details

Date Published: 24 August 2010
PDF: 10 pages
Proc. SPIE 7767, Instrumentation, Metrology, and Standards for Nanomanufacturing IV, 77670Q (24 August 2010); doi: 10.1117/12.861004
Show Author Affiliations
N. Shirato, The Univ. of Tennessee (United States)
H. Krishna, Washington Univ. in St. Louis (United States)
A. K. Gangopadhyay, Washington Univ. in St. Louis (United States)
R. Kalyanaraman, The Univ. of Tennessee (United States)

Published in SPIE Proceedings Vol. 7767:
Instrumentation, Metrology, and Standards for Nanomanufacturing IV
Michael T. Postek, Editor(s)

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