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Proceedings Paper

A comprehensive study of the contributions to the nonlinear optical properties of thin Ag films
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Paper Abstract

We report on the nonlinear optical (NLO) transmittance and reflectance of a 20 nm-thick Ag film characterized by time-resolved white-light continuum pump-probe experiments. The change in complex permittivity Δε(t) is extracted and is fitted to the Drude model in the frequency domain and a two-temperature model in the time domain. A unified model is presented that fully describes the dynamic NLO response of a thin Ag film that can be incorporated easily into the modeling of more complex metal-dielectric multilayer structures designed to take advantage of the NLO response of Ag.

Paper Details

Date Published: 10 September 2010
PDF: 11 pages
Proc. SPIE 7756, Active Photonic Materials III, 77560K (10 September 2010); doi: 10.1117/12.860930
Show Author Affiliations
Daniel Owens, Georgia Institute of Technology (United States)
Canek Fuentes-Hernandez, Georgia Institute of Technology (United States)
Joel M. Hales, Georgia Institute of Technology (United States)
Joseph W. Perry, Georgia Institute of Technology (United States)
Bernard Kippelen, Georgia Institute of Technology (United States)

Published in SPIE Proceedings Vol. 7756:
Active Photonic Materials III
Ganapathi S. Subramania; Stavroula Foteinopoulou, Editor(s)

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