Share Email Print
cover

Proceedings Paper

Diffraction depth of focus in optical microscope
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The paper presents the mathematical technique for calculation of the diffraction depth of focus of an optical system of a widefield microscope. The proposed technique applies the Rayleigh criterion based on evaluation of the wave aberration appeared due to defocus in a high aperture optical system. The maximal value of a linear approximation of the defocus wave aberration is used to define the depth of focus. It is proven that in optical systems with numerical aperture higher than 0.5 have the diffraction depth of focus 25 - 40 % smaller than the widely known formula defines. This fact is important for implementation of autofocus and digital focus extension algorithms. The non-sophisticated formula for calculation of the depth of focus is proposed. The results of experimental measurements of the depth of focus are presented and discussed.

Paper Details

Date Published: 19 August 2010
PDF: 11 pages
Proc. SPIE 7786, Current Developments in Lens Design and Optical Engineering XI; and Advances in Thin Film Coatings VI, 77860X (19 August 2010); doi: 10.1117/12.860912
Show Author Affiliations
Volodymyr Borovytsky, National Technical Univ. of Ukraine (Ukraine)
Andrey Fesenko, National Technical Univ. of Ukraine (Ukraine)


Published in SPIE Proceedings Vol. 7786:
Current Developments in Lens Design and Optical Engineering XI; and Advances in Thin Film Coatings VI
R. Barry Johnson; Virendra N. Mahajan; Simon Thibault, Editor(s)

© SPIE. Terms of Use
Back to Top