Share Email Print
cover

Proceedings Paper

Deterministic sequential stray light analysis
Author(s): Michael G. Dittman; Eric Donley; Frank Grochocki
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Non-sequential ray tracing for stray light analyses have demonstrated value, but are over-constrained when high sampling and speed are both needed. In cases where real geometry and mechanical surface properties are critical, such analyses are certainly required. But the goal of these analyses is often to attempt to approach the performance that would be achieved if only the optics contributed scatter and only through the sequential optical path. In other words, optical element scatter is the limiting case for system performance. An analysis technique is therefore presented that enables approximate but rapid sequential stray light estimates through deterministic modeling. Results of correlation to nonsequential analyses demonstrate the large range of applicability of this approach. Examples of parametric studies show the value of rapid paraxial estimates for understanding system performance sensitivities.

Paper Details

Date Published: 7 September 2010
PDF: 9 pages
Proc. SPIE 7794, Optical System Contamination: Effects, Measurements, and Control 2010, 77940T (7 September 2010); doi: 10.1117/12.860861
Show Author Affiliations
Michael G. Dittman, Ball Aerospace & Technologies Corp. (United States)
Eric Donley, Ball Aerospace & Technologies Corp. (United States)
Frank Grochocki, Ball Aerospace & Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 7794:
Optical System Contamination: Effects, Measurements, and Control 2010
Sharon A. Straka; Nancy Carosso, Editor(s)

© SPIE. Terms of Use
Back to Top