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Proceedings Paper

Short wave infrared imaging spectrometer with simultaneous thermal imaging
Author(s): William R. Johnson; Daniel W. Wilson; Alejandro Diaz
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Paper Abstract

A computed tomographic imaging spectrometer (CTIS) has been developed to allow simultaneous shortwave infrared (SWIR: 1-1.4 μm) spectral imaging and mid-wave infrared (MWIR: 3-5 μm) thermal imaging. The instrument utilizes a mechanically cooled indium antimonide focal plane array which is optically coupled using an Offner relay to a state-of the-art two-dimensional grating. The grating is a computer-generated hologram design fabricated by electron-beam lithography on a convex substrate. The system performs shapshot capture of the spatial and spectral information in a scene, enabling transient events to be characterized. The shortwave spectral information in the higher diffraction orders was reconstructed using existing expectation maximization methodologies while a co-registered thermal image from the zerothorder was analyzed. A co-registered contour map of the shortwave information was displayed superimposed on the thermal image and processed for accurate retrieval of scene knowledge. Spectral accuracy and radiometric test and evaluation results such as noise equivalence temperature difference (NEDT) and minimum resolvable temperature difference (MRTD) are presented for this new spectral imager and a general explanation is given for the theory of its tomographic operation.

Paper Details

Date Published: 13 August 2010
PDF: 8 pages
Proc. SPIE 7812, Imaging Spectrometry XV, 781202 (13 August 2010); doi: 10.1117/12.860789
Show Author Affiliations
William R. Johnson, Jet Propulsion Lab. (United States)
Daniel W. Wilson, Jet Propulsion Lab. (United States)
Alejandro Diaz, ATEC U.S. Army (United States)


Published in SPIE Proceedings Vol. 7812:
Imaging Spectrometry XV
Sylvia S. Shen; Paul E. Lewis, Editor(s)

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