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Proceedings Paper

X-ray grating interferometer for imaging at a second-generation synchrotron radiation source
Author(s): Julia Herzen; Felix Beckmann; Tilman Donath; Malte Ogurreck; Christian David; Franz Pfeiffer; Jürgen Mohr; Elena Reznikova; Stefan Riekehr; Astrid Haibel; Georg Schulz; Bert Müller; Andreas Schreyer
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Paper Abstract

X-ray phase-contrast radiography and tomography enables to increase contrast for weakly absorbing materials. Recently, x-ray grating interferometers were developed which extend the possibility of phase-contrast imaging from highly brilliant radiation sources like third-generation synchrotron even to non-coherent sources. Here, we present a setup of an x-ray grating interferometer designed and installed at low-coherence wiggler source at the GKSS beamline W2 (HARWI II) operated at the second-generation synchrotron storage ring DORIS at the Deutsches Elektronen-Synchrotron (DESY, Hamburg, Germany). The beamline is dedicated to imaging in materials science. Equipped with the grating interferometer, it is the first synchrotron radiation beamline with a three-grating setup combining the advantages of phase-contrast imaging with monochromatic radiation with very high flux and a sufficiently large field of view for centimeter sized objects. Examples of radiography on laser-welded aluminum and magnesium joints are presented to demonstrate the high potential of the new gratingbased setup in the field of materials science. In addition, the results of an off-axis phase-contrast tomography of a human urethra with 15 mm in diameter are presented showing internal structures, which cannot be resolved by the conventional tomography in absorption mode.

Paper Details

Date Published: 20 September 2010
PDF: 10 pages
Proc. SPIE 7804, Developments in X-Ray Tomography VII, 780407 (20 September 2010); doi: 10.1117/12.860733
Show Author Affiliations
Julia Herzen, GKSS-Forschungszentrum Geesthacht (Germany)
Technische Univ. München (Germany)
Felix Beckmann, GKSS-Forschungszentrum Geesthacht (Germany)
Tilman Donath, Dectris AG (Switzerland)
Paul Scherrer Institut (Switzerland)
Malte Ogurreck, GKSS-Forschungszentrum Geesthacht (Germany)
Christian David, Paul Scherrer Institut (Switzerland)
Franz Pfeiffer, Technische Univ. München (Germany)
Jürgen Mohr, Karlsruher Institut für Technologie (Germany)
Elena Reznikova, Karlsruher Institut für Technologie (Germany)
Stefan Riekehr, GKSS-Forschungszentrum Geesthacht (Germany)
Astrid Haibel, GKSS-Forschungszentrum Geesthacht (Germany)
Georg Schulz, Univ. Basel (Switzerland)
Bert Müller, Univ. Basel (Switzerland)
Andreas Schreyer, GKSS-Forschungszentrum Geesthacht (Germany)


Published in SPIE Proceedings Vol. 7804:
Developments in X-Ray Tomography VII
Stuart R. Stock, Editor(s)

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