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Proceedings Paper

Equivalent admittance of a semi-continuous silver film
Author(s): Yi-Jun Jen; Chia-Feng Lin; Jau-Huei Lin
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Paper Abstract

Semi-continuous silver films (SSFs) with different filling fractions are papered on BK7 substrate in electron beam evaporation system. The microstructural and optical properties are studied near the percolation threshold. From morphological evolution, the transition from nanograins, through nanoclusters to near uniform film can be observed in SEM images. As the filling fraction increasing, the transmittance variation over the wavelength range from 800 nm to 2400 nm is changed from an increasing behavior to a decreasing behavior. The spectral transmittance and reflectance of the SSFs are essentially constant near the percolation threshold in the infrared. The thickness of growing MgF2 film is measured at the wavelength of 532 nm by optical monitoring and stopped coating at the crest of the curve in monitor chart. Equivalent admittance of a semi-continuous silver film at the MgF2/SSF can be retrieved using characteristic matrix. With different filling fraction, the variations of equivalent admittance of a semi-continuous silver film at the MgF2/SSF are discussed.

Paper Details

Date Published: 23 August 2010
PDF: 6 pages
Proc. SPIE 7766, Nanostructured Thin Films III, 77660G (23 August 2010); doi: 10.1117/12.860563
Show Author Affiliations
Yi-Jun Jen, National Taipei Univ. of Technology (Taiwan)
Chia-Feng Lin, National Taipei Univ. of Technology (Taiwan)
Jau-Huei Lin, National Taipei Univ. of Technology (Taiwan)


Published in SPIE Proceedings Vol. 7766:
Nanostructured Thin Films III
Raúl J. Martin-Palma; Yi-Jun Jen; Akhlesh Lakhtakia, Editor(s)

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