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Proceedings Paper

Key components for artifact-free micro-CT and nano-CT instruments
Author(s): Alexander Sasov; Bart Pauwels; Xuan Liu; Peter Bruyndonckx
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Paper Abstract

Proper selection of modern key components allows eliminating most artifacts in micro-CT and nano-CT systems already during data acquisition. X-ray cameras with direct photon detection allow avoiding ring artifacts. Newly developed fully depleted CCD sensors show an energy response similar to traditional cameras with a thin scintillator, but without any geometrical distortions and flashes from x-ray photons penetrating through the fiber optics. Air-bearing rotation stages and piezo-positioning minimizes mechanical inaccuracies in acquiring angular projections. Beam hardening can be eliminated by energy-selective photon counting imaging.

Paper Details

Date Published: 2 September 2010
PDF: 10 pages
Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040U (2 September 2010); doi: 10.1117/12.860380
Show Author Affiliations
Alexander Sasov, SkyScan N.V. (Belgium)
Bart Pauwels, SkyScan N.V. (Belgium)
Xuan Liu, SkyScan N.V. (Belgium)
Peter Bruyndonckx, SkyScan N.V. (Belgium)


Published in SPIE Proceedings Vol. 7804:
Developments in X-Ray Tomography VII
Stuart R. Stock, Editor(s)

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