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Proceedings Paper

Assessment of ESD robustness in high power light emitting diodes
Author(s): Shih-Chun Yang; Pang Lin; Han-Kuei Fu; Chien-Ping Wang; Tzung-Te Chen; An-Tse Lee; Sheng-Bang Huang; Pei-Ting Chou; Wei Wang; Fu-Jen Kao
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Paper Abstract

The capability of high-power nitride-based light-emitting diodes (HPLED) to withstand electrostatic discharge (ESD) is very important key index due to the horizontal structure of the insulating property of the sapphire substrate. However, it is difficult to real-time monitor the damage caused by the ESD stress because it occurred in a very short period. Current-voltage (I-V) curves and electroluminescence (EL) spectrum were applied to study the change during the series ESD stress. Time-resolved optical beam induced current (TR-OBIC) was used to analyze the characteristics of the delay time between normal region and the defect point caused by ESD stress. Transmission electron microscopy (TEM) was used to compare to the difference in the distribution of damage region and investigate the failure modes. During the series ESD stresses, V-shaped pits suffered from the high electrical field and the distance from multi-quantum well (MQW). The bottom of V-shaped defect would be one of index to assess the ESD endurance of LED chips.

Paper Details

Date Published: 18 August 2010
PDF: 7 pages
Proc. SPIE 7784, Tenth International Conference on Solid State Lighting, 778419 (18 August 2010); doi: 10.1117/12.860322
Show Author Affiliations
Shih-Chun Yang, National Chiao Tung Univ. (Taiwan)
Pang Lin, National Chiao Tung Univ. (Taiwan)
Han-Kuei Fu, Industrial Technology Research Institute (Taiwan)
Chien-Ping Wang, Industrial Technology Research Institute (Taiwan)
Tzung-Te Chen, Industrial Technology Research Institute (Taiwan)
An-Tse Lee, Industrial Technology Research Institute (Taiwan)
Sheng-Bang Huang, Industrial Technology Research Institute (Taiwan)
Pei-Ting Chou, Industrial Technology Research Institute (Taiwan)
Wei Wang, National Sun Yat-Sen Univ. (Taiwan)
Fu-Jen Kao, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 7784:
Tenth International Conference on Solid State Lighting
Ian Ferguson; Matthew H. Kane; Nadarajah Narendran; Tsunemasa Taguchi, Editor(s)

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