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Proceedings Paper

Deciphering complex, functional structures with synchrotron-based absorption and phase contrast tomographic microscopy
Author(s): M. Stampanoni; J. Reichold; B. Weber; D. Haberthür; J. Schittny; J. Eller; F. N. Büchi; F. Marone
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Paper Abstract

Nowadays, thanks to the high brilliance available at modern, third generation synchrotron facilities and recent developments in detector technology, it is possible to record volumetric information at the micrometer scale within few minutes. High signal-to-noise ratio, quantitative information on very complex structures like the brain micro vessel architecture, lung airways or fuel cells can be obtained thanks to the combination of dedicated sample preparation protocols, in-situ acquisition schemes and cutting-edge imaging analysis instruments. In this work we report on recent experiments carried out at the TOMCAT beamline of the Swiss Light Source [1] where synchrotron-based tomographic microscopy has been successfully used to obtain fundamental information on preliminary models for cerebral fluid flow [2], to provide an accurate mesh for 3D finite-element simulation of the alveolar structure of the pulmonary acinus [3] and to investigate the complex functional mechanism of fuel cells [4]. Further, we introduce preliminary results on the combination of absorption and phase contrast microscopy for the visualization of high-Z nanoparticles in soft tissues, a fundamental information when designing modern drug delivery systems [5]. As an outlook we briefly discuss the new possibilities offered by high sensitivity, high resolution grating interferomtery as well as Zernike Phase contrast nanotomography [6].

Paper Details

Date Published: 20 September 2010
PDF: 15 pages
Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040L (20 September 2010); doi: 10.1117/12.860208
Show Author Affiliations
M. Stampanoni, Paul Scherrer Institut (Switzerland)
ETH Zurich (Switzerland)
J. Reichold, ETH Zurich (Switzerland)
B. Weber, Univ. Zürich (Switzerland)
D. Haberthür, Univ. Bern (Switzerland)
J. Schittny, Univ. Bern (Switzerland)
J. Eller, Paul Scherrer Institut (Switzerland)
F. N. Büchi, Paul Scherrer Institut (Switzerland)
F. Marone, Paul Scherrer Institut (Switzerland)

Published in SPIE Proceedings Vol. 7804:
Developments in X-Ray Tomography VII
Stuart R. Stock, Editor(s)

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